A Generalized Test Generation Procedure for Path Delay Faults.
Irith PomeranzSudhakar M. ReddyPublished in: FTCS (1998)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- symbolic execution
- design automation
- quality assurance
- software testing
- static analysis
- regression testing
- shortest path
- fault diagnosis
- databases
- object oriented
- test set
- fault detection
- integrity constraints
- code coverage
- model based diagnosis
- database
- database applications
- feature space
- information systems
- machine learning
- neural network
- data sets