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Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation.
Yoshinobu Higami
Kewal K. Saluja
Hiroshi Takahashi
Yuzo Takamatsu
Published in:
VLSI Design (2007)
Keyphrases
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test generation
test cases
high speed
fault detection
design automation
data sets
fault diagnosis
test sequences
databases
multi agent
software testing
mutation testing
silicon dioxide
image processing
database systems