Parametric Circuit Fault Diagnosis Through Oscillation-Based Testing in Analogue Circuits: Statistical and Deep Learning Approaches.
Jacob B. CloeteTinus StanderDaniel N. WilkePublished in: IEEE Access (2022)
Keyphrases
- fault diagnosis
- analog circuits
- deep learning
- neural network
- expert systems
- fault detection
- fault detection and diagnosis
- electronic equipment
- chemical process
- bp neural network
- condition monitoring
- digital circuits
- fuzzy logic
- gas turbine
- machine learning
- circuit design
- unsupervised learning
- rotating machinery
- power transformers
- multiple faults
- multi sensor information fusion
- monitoring and fault diagnosis
- operating conditions
- dimensionality reduction
- control system
- pairwise
- object recognition
- support vector
- feature extraction
- genetic algorithm
- data mining