Transistor stuck-on fault detection tests for digital CMOS circuits.
Xijiang LinSudhakar M. ReddyJanusz RajskiPublished in: ETS (2016)
Keyphrases
- fault detection
- circuit design
- high speed
- low power
- mixed signal
- power dissipation
- fault diagnosis
- industrial processes
- floating gate
- fault identification
- condition monitoring
- tennessee eastman
- failure detection
- vlsi circuits
- fuel cell
- power consumption
- fault detection and diagnosis
- analog vlsi
- fault localization
- metal oxide semiconductor
- robust fault detection
- power plant
- delay insensitive
- low cost
- chip design
- fault detection and isolation
- cmos technology
- decision makers
- expert systems
- decision making
- artificial intelligence
- wide dynamic range
- genetic algorithm
- machine learning
- neural network