A Diagnostic Test Generation Procedure for Combinational Circuits Based on Test Elimination.

Irith Pomeranz W. Kent Fuchs

Published in: Asian Test Symposium (1998)

Keyphrases

test generation
test cases
test sequences
design automation
symbolic execution
software testing
static analysis
asynchronous circuits
logic circuits
mutation testing
code coverage
test data generation
regression testing
expert systems
decision making
high speed
test suite
object oriented
diagnostic tests