Multiple Fault Testing of Large Circuits by Single Fault Test Sets.
Vinod K. AgarwalAndy S. F. FungPublished in: IEEE Trans. Computers (1981)
Keyphrases
- test set
- test cases
- fault detection
- fault diagnosis
- fault model
- training set
- test data
- error rate
- fault injection
- high speed
- real time embedded systems
- fault models
- active learning
- failure modes
- training data
- software testing
- evaluation methodology
- transmission line
- analog circuits
- expert systems
- decision trees
- data sets