Test Generation for Ultra-Large Circuits Using ATPG Constraints and Test-Pattern Templates.

Peter Wohl John A. Waicukauski

Published in: ITC (1996)

Keyphrases

test generation
test cases
high speed
test sequences
symbolic execution
design automation
software testing
static analysis
mutation testing
code coverage
quality assurance
pattern matching
regression testing
test suite
case study
databases
software development
software engineering
training data