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A concurrent approach for testing address decoder faults in eFlash memories.
Olivier Ginez
Patrick Girard
Christian Landrault
Serge Pravossoudovitch
Arnaud Virazel
Jean Michel Daga
Published in:
ITC (2007)
Keyphrases
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test cases
fault model
low complexity
fault diagnosis
model based diagnosis
fault detection
concurrent programs
test data
real time
motion estimation
software engineering
decoding algorithm
fpga implementation
concurrent execution