Test generation for path-delay faults in one-dimensional iterative logic arrays.
Nabil M. AbdulrazzaqSandeep K. GuptaPublished in: ITC (2000)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- symbolic execution
- design automation
- static analysis
- software testing
- built in self test
- shortest path
- quality assurance
- test data generation
- code coverage
- fault diagnosis
- modal logic
- training set
- databases
- fault detection
- test set
- open source
- programming language
- decision trees
- image processing
- firing squad synchronization