Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing.
Meng-Fan WuJiun-Lang HuangXiaoqing WenKohei MiyasePublished in: ITC (2008)
Keyphrases
- test data
- power supply
- test cases
- test set
- search based testing
- training data
- testing process
- real time
- data sets
- test generation
- software testing
- training set
- missing data
- high frequency
- test suite
- intelligent control
- decision trees
- query language
- test data generation
- multiscale
- training and test data
- neural network
- decision making
- image processing
- error rate
- image compression