Meng-Fan Wu

Publication Activity (10 Years)

Years Active: 2007-2015
Publications (10 Years): 3

Top Topics

Unique Features

Communication Systems

Top Venues

Publications

Huan-Ching Liu, Chi-Hsiang Lin, Chun-Ting Lin, Chia-Chien Wei, Hou-Tzu Huang, Hsun-Hao Hsu, Meng-Fan Wu, Sien Chi
Simple receiving scheme in 100-GHz DD OFDM RoF systems employing low-sampling-rate ADCs and digital preprocess. OFC (2015)
Meng-Fan Wu, Bo Yang, Fei-Fei Hu, Liu-Wen Liao
Analyses on spatiotemporal patterns of impervious surface coverage in Changsha metropolitan area. Geoinformatics (2015)
Che-Hao Li, Meng-Fan Wu, Chi-Hsiang Lin, Chun-Ting Lin
W-band OFDM RoF system with simple envelope detector down-conversion. OFC (2015)
Chun-Yong Liang, Meng-Fan Wu, Jiun-Lang Huang
Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan Testing. Asian Test Symposium (2010)
Meng-Fan Wu, Kun-Han Tsai, Wu-Tung Cheng, Hsin-Cheih Pan, Jiun-Lang Huang, Augusli Kifli
A scalable quantitative measure of IR-drop effects for scan pattern generation. ICCAD (2010)
Meng-Fan Wu, Hsin-Cheih Pan, T.-H. Wang, Jiun-Lang Huang, Kun-Han Tsai, Wu-Tung Cheng
Improved weight assignment for logic switching activity during at-speed test pattern generation. ASP-DAC (2010)
Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang
LPTest: a Flexible Low-Power Test Pattern Generator. J. Electron. Test. 25 (6) (2009)
Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase
Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (11) (2009)
Yi-Tsung Lin, Meng-Fan Wu, Jiun-Lang Huang
PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment. ATS (2008)
Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase
Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing. ITC (2008)
Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang
An Efficient Peak Power Reduction Technique for Scan Testing. ATS (2007)