Storage Based Built-In Test Pattern Generation Method for Close-to-Functional Broadside Tests.
Irith PomeranzPublished in: IOLTS (2020)
Keyphrases
- generation method
- test data
- test generation
- test suite
- test cases
- multiple choice
- pattern matching
- statistical tests
- data storage
- file system
- storage requirements
- pattern detection
- post hoc
- storage space
- null hypothesis
- test statistic
- flight test
- diagnostic tests
- real time
- data management
- data analysis
- database systems
- neural network
- databases