On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set.
Hafizur RahamanDipak Kumar KoleDebesh Kumar DasBhargab B. BhattacharyaPublished in: VLSI Design (2008)
Keyphrases
- test set
- error rate
- test cases
- training set
- training data
- object detection
- dermoscopy images
- test data
- evaluation methodology
- false positives
- high speed
- fault diagnosis
- detection method
- detection rate
- detection accuracy
- class distribution
- markov chain
- automated detection
- random selection
- face detection
- missing data
- computer vision
- fault models
- built in self test