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Interconnect Testing and Test-Path Scheduling for Interposer-Based 2.5-D ICs.
Ran Wang
Krishnendu Chakrabarty
Sudipta Bhawmik
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)
Keyphrases
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test cases
software testing
test data
regression testing
test generation
testing process
statistical tests
test sequences
scheduling problem
test case generation
round robin
high speed
item response theory
flexible manufacturing systems
resource allocation
shortest path
integration testing