Design of testing circuit and test generation for built-in current testing.
Yukiya MiuraYasushi WadaKozo KinoshitaPublished in: Systems and Computers in Japan (1993)
Keyphrases
- test generation
- design automation
- test cases
- software testing
- symbolic execution
- test sequences
- design process
- quality assurance
- circuit design
- mutation testing
- high speed
- static analysis
- code coverage
- regression testing
- test suite
- data sets
- test data generation
- quality assessment
- test set
- database systems
- information systems