Novel Approach to Clock Fault Testing for High Performance Microprocessors.

Cecilia Metra Martin Omaña T. M. Mak Simon Tam

Published in: VTS (2007)

Keyphrases

fault model
real time embedded systems
power consumption
high speed
fault diagnosis
fault detection
computer architecture
fault injection
test set
test cases
test data
neural network
computing power
fuzzy logic
data intensive
test generation
single chip
scientific computing
expert systems
information systems