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Genetic-algorithm-based test generation for current testing of bridging faults in CMOS VLSI circuits.
Terry Lee
Ibrahim N. Hajj
Elizabeth M. Rudnick
Janak H. Patel
Published in:
VTS (1996)
Keyphrases
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vlsi circuits
test generation
test cases
mutation testing
symbolic execution
test sequences
software testing
design automation
low power
regression testing
code coverage
quality assurance
test suite
test data generation
mixed signal
artificial intelligence
static analysis
database
fault model
data sets