Latch Susceptibility to Transient Faults and New Hardening Approach.

Martin Omaña Daniele Rossi Cecilia Metra

Published in: IEEE Trans. Computers (2007)

Keyphrases

fault diagnosis
steady state
fault detection
high density
multiple faults
power consumption
low power
model based diagnosis
fault model
abnormal events
fault identification
test cases
temperature field
root cause
finite element method
data structure
decision trees
artificial intelligence