Fault Detection By Consumption Measurement in CMOS Circuits.
Mireille JacominoJ. L. RainardRene DavidPublished in: Fehlertolerierende Rechensysteme (1987)
Keyphrases
- fault detection
- analog vlsi
- delay insensitive
- high speed
- circuit design
- fault diagnosis
- vlsi circuits
- industrial processes
- cmos technology
- tennessee eastman
- fault identification
- condition monitoring
- chip design
- low power
- floating gate
- focal plane
- low cost
- fault detection and isolation
- power consumption
- failure detection
- fault detection and diagnosis
- random access memory
- power dissipation
- asynchronous circuits
- fuel cell
- robust fault detection
- low voltage
- fault localization
- fault isolation
- gas turbine
- power plant
- case based reasoning
- decision making
- neural network
- chemical process
- power supply
- intelligent systems