J. L. Rainard

Publication Activity (10 Years)

Years Active: 1987-1994
Publications (10 Years): 0

Publications

G. Masseboeuf, J. Pulou, J. L. Rainard
Hierarchical Test Analysis of VLSI Circuits for Random BIST. EDCC (1994)
P. Thorel, J. L. Rainard, A. Botta, A. Chemarin, J. Majos
Implementing Boundary-Scan and Pseudo-Random BIST in an Asynchronous Transfer Mode Switch. ITC (1991)
Rene David, S. Rahal, J. L. Rainard
Some relationships between delay testing and stuck-open testing in CMOS circuits. EURO-DAC (1990)
Mireille Jacomino, J. L. Rainard, Rene David
Fault Detection By Consumption Measurement in CMOS Circuits. Fehlertolerierende Rechensysteme (1987)