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Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis.
Nandu Tendolkar
Dawit Belete
Bill Schwarz
Bob Podnar
Akshay Gupta
Steve Karako
Wu-Tung Cheng
Alex Babin
Kun-Han Tsai
Nagesh Tamarapalli
Greg Aldrich
Published in:
ITC (2006)
Keyphrases
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fault diagnosis
fault detection
multiple faults
diagnostic tests
pattern matching
high quality
high speed
low quality
fault isolation
fault detection and diagnosis
pattern discovery
normal operation
database
pattern languages
failure modes
test cases
data sets
real time