Precise test generation for resistive bridging faults of CMOS combinational circuits.
Toshiyuki MaedaKozo KinoshitaPublished in: ITC (2000)
Keyphrases
- test generation
- test cases
- mutation testing
- delay insensitive
- analog vlsi
- asynchronous circuits
- logic circuits
- low power
- circuit design
- high speed
- vlsi circuits
- test sequences
- symbolic execution
- cmos technology
- power dissipation
- design automation
- static analysis
- floating gate
- power consumption
- software testing
- built in self test
- low voltage
- quality assurance
- random access memory
- chip design
- test data generation
- mixed signal
- focal plane
- low cost
- real world
- fault diagnosis
- fault model
- data sets
- infrared
- test set
- code coverage
- open source
- case study