On the Distribution of Fault Coverage and Test length in Random Testing of Combinational Circuits.
Amitava MajumdarSarma SastryPublished in: DAC (1992)
Keyphrases
- test cases
- uniformly distributed
- software testing
- test data
- test generation
- logic circuits
- statistical tests
- test suite
- heavy tailed
- test case generation
- test statistic
- spatial distribution
- high speed
- testing process
- shift register
- test data generation
- normal distribution
- set of test cases
- integration testing
- null hypothesis
- data sets
- asynchronous circuits
- usability testing
- regression testing
- statistically significant
- software engineering
- case study