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A parallel-vector concurrent-fault simulator and generation of single-input-change tests for path-delay faults.
Marwan A. Gharaybeh
Michael L. Bushnell
Vishwani D. Agrawal
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1998)
Keyphrases
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fault diagnosis
fault detection
fault model
multiple faults
fault detection and isolation
expert systems
test cases
simulation model
shortest path
input vector
vector space
statistical tests
parallel implementation
generation process
input data
fuzzy logic
neural network