Output Hazard-Free Transition Tests for Silicon Calibrated Scan Based Delay Testing.

Adit D. Singh Gefu Xu

Published in: VTS (2006)

Keyphrases

test cases
test suite
statistical tests
test generation
test data
low cost
high speed
input data
state transition
code coverage
item response theory
high density
risk assessment
multi view
test set
regression testing
data sets
real time