Conduction mechanisms of silicon oxide/titanium oxide MOS stack structures.
Julio C. TinocoMagali EstradaBenjamín IñíguezAntonio CerdeiraPublished in: Microelectron. Reliab. (2008)
Keyphrases
- field effect transistors
- silicon nitride
- electrical properties
- high density
- si sio
- silicon dioxide
- steady state
- thin film
- mathematical analysis
- transmission electron microscopy
- fuel cell
- semiconductor devices
- space charge
- electron microscopy
- x ray
- information systems
- neural network
- building blocks
- website
- metal oxide
- artificial intelligence