Test Generation for Non-separable RTL Controller-datapath Circuits using a Satisfiability based Approach.
Loganathan LingappanSrivaths RaviNiraj K. JhaPublished in: ICCD (2003)
Keyphrases
- test generation
- test cases
- test sequences
- design automation
- symbolic execution
- control system
- quality assurance
- circuit design
- satisfiability problem
- mutation testing
- static analysis
- high speed
- computational complexity
- software testing
- np complete
- test data generation
- control strategy
- closed loop
- quality control
- regression testing
- information systems
- phase transition
- relational databases
- high level
- databases
- database