CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing.
Mounir BenabdenbiWalid MaroufiMeryem MarzoukiPublished in: J. Electron. Test. (2002)
Keyphrases
- high speed
- software testing
- test cases
- test generation
- low cost
- real time
- access control
- test data
- cooperative
- computing environments
- statistical tests
- high density
- host computer
- test suite
- dynamic environments
- mobile robot
- object oriented
- single chip
- test sequences
- regression testing
- usability testing
- test data generation
- multiple autonomous
- educational materials
- analog vlsi
- multi agent