Genetic-Algorithm-based Test Pattern Generation for Crosstalk Faults between On-Chip Aggressor and Victim.
Kishore K. DuganapalliAjoy Kumar PalitWalter AnheierPublished in: J. Circuits Syst. Comput. (2016)
Keyphrases
- built in self test
- fault diagnosis
- low cost
- high speed
- fault detection
- single chip
- analog vlsi
- model based diagnosis
- high density
- programmable logic
- physical design
- vlsi design
- correlation analysis
- multiple faults
- fault model
- vlsi implementation
- host computer
- integrated circuit
- root cause
- database
- image sensor
- fault detection and isolation
- expert systems
- real time