A novel test generation approach for parametric faults in linear analog circuits .

Hong Helena Zheng Ashok Balivada Jacob A. Abraham

Published in: VTS (1996)

Keyphrases

test generation
analog circuits
fault diagnosis
test cases
mutation testing
symbolic execution
test sequences
digital circuits
neural network
design automation
static analysis
quality assurance
expert systems
software testing
test suite
model based diagnosis
dynamic systems
case study
decision trees
computer vision