An improved local feature descriptor based on SIFT.
Kaiyang LiaoGuizhong LiuPublished in: ICIMCS (2010)
Keyphrases
- feature descriptors
- image matching
- feature points
- image features
- scale invariant feature transform
- local binary pattern
- shape features
- sift features
- feature distributions
- shape descriptors
- distance metric
- texture classification
- image patches
- scale invariant
- shape analysis
- computer vision
- matching algorithm
- image classification
- pattern recognition
- high quality
- image segmentation
- image processing