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Experts
- Maks Ovsjanikov
- Leonidas J. Guibas
- Daniel Cohen-Or
- Paul L. Rosin
- Jovisa D. Zunic
- Kálmán Palágyi
- Afzal Godil
- Longin Jan Latecki
- Daniel Cremers
- Michael M. Bronstein
- Hao Zhang
- Dengsheng Zhang
- Alexander M. Bronstein
- Bianca Falcidieno
- Guojun Lu
- Xiang Bai
- Edwin R. Hancock
- Michela Spagnuolo
- Wenping Wang
- Emanuele Rodolà
- Faouzi Ghorbel
- Kaleem Siddiqi
- Salvatore Tabbone
- Silvia Biasotti
- Ryutarou Ohbuchi
- Siddhartha Chaudhuri
- Edmond Boyer
- Dariusz Frejlichowski
- Ching Y. Suen
- A. Murat Tekalp
- Remco C. Veltkamp
- Ross T. Whitaker
- Hiroshi Ishii
- Guido Gerig
- Adrien Bartoli
- Vladimir G. Kim
- Chandan Singh
- Jitendra Malik
- Takahiko Furuya
Venues
- CoRR
- Pattern Recognit.
- CVPR
- ICIP
- ICPR
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- IROS
- ICRA
- Sensors
- IEEE Access
- ACM Trans. Graph.
- ICASSP
- ICCV
- Comput. Graph. Forum
- NeuroImage
- IEEE Trans. Image Process.
- Vis. Comput.
- Comput. Graph.
- CHI
- ISBI
- Remote. Sens.
- BMVC
- Int. J. Comput. Vis.
- Comput. Aided Des.
- Neurocomputing
- Medical Imaging: Image Processing
- IGARSS
- Comput. Vis. Image Underst.
- J. Electronic Imaging
- EMBC
- Image Vis. Comput.
- 3DOR@Eurographics
- Expert Syst. Appl.
- IEEE Trans. Geosci. Remote. Sens.
- ICDAR
- ROBIO
- J. Vis. Commun. Image Represent.
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