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Experts
- Maks Ovsjanikov
- Leonidas J. Guibas
- Daniel Cohen-Or
- Paul L. Rosin
- Jovisa D. Zunic
- Longin Jan Latecki
- Afzal Godil
- Michael M. Bronstein
- Daniel Cremers
- Kálmán Palágyi
- Hao Zhang
- Dengsheng Zhang
- Xiang Bai
- Bianca Falcidieno
- Guojun Lu
- Alexander M. Bronstein
- Edwin R. Hancock
- Michela Spagnuolo
- Faouzi Ghorbel
- Emanuele Rodolà
- Wenping Wang
- Kaleem Siddiqi
- Salvatore Tabbone
- Silvia Biasotti
- Ryutarou Ohbuchi
- Dariusz Frejlichowski
- A. Murat Tekalp
- Siddhartha Chaudhuri
- Edmond Boyer
- Hiroshi Ishii
- Ross T. Whitaker
- Ching Y. Suen
- Remco C. Veltkamp
- Guido Gerig
- Jitendra Malik
- Adrien Bartoli
- Takahiko Furuya
- Vladimir G. Kim
- Chandan Singh
Venues
- CoRR
- Pattern Recognit.
- CVPR
- ICIP
- ICPR
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- IROS
- ACM Trans. Graph.
- Sensors
- ICASSP
- ICRA
- IEEE Access
- ICCV
- NeuroImage
- Comput. Graph. Forum
- IEEE Trans. Image Process.
- BMVC
- ISBI
- Vis. Comput.
- Comput. Aided Des.
- Int. J. Comput. Vis.
- Comput. Graph.
- Remote. Sens.
- Medical Imaging: Image Processing
- Comput. Vis. Image Underst.
- Neurocomputing
- IGARSS
- J. Electronic Imaging
- CHI
- 3DOR@Eurographics
- EMBC
- Image Vis. Comput.
- ICDAR
- Int. J. Pattern Recognit. Artif. Intell.
- ROBIO
- IEEE Robotics Autom. Lett.
- J. Vis. Commun. Image Represent.
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