FEATURE DISTRIBUTIONS
Experts
- Matti Pietikäinen
- Timo Ojala
- Dah-Jye Lee
- Alok Desai
- Subrahmanyam Murala
- Ram Sarkar
- Dan A. Ventura
- William Robson Schwartz
- Wankou Yang
- Varun Jampani
- Ayan Kumar Bhunia
- Zhefan Rao
- R. Venkatesh Babu
- Wei-Chung Kang
- Ni Lao
- Anurag Katakkar
- Avirup Bhattacharyya
- Wendong Bi
- Spencer G. Fowers
- Qiang Fu
- Krzysztof Janowicz
- Penghao Wu
- Nathan Inkawhich
- Ricardo Toledo
- Jun Tang
- Boyang Li
- Manel Benaissa
- Marco Viola
- Xiangyu Fan
- Tejan Karmali
- Ehsan Adeli
- Lawrence Carin
- Jing Lin
- Junwei Han
- Kilian M. Pohl
- Pu Yan
- Yanwei Fu
- Laura Antonelli
- Yiran Chen
Venues
- CoRR
- ICIP
- Pattern Recognit.
- ICPR
- Neurocomputing
- Multim. Tools Appl.
- ICASSP
- IEEE Access
- Remote. Sens.
- Expert Syst. Appl.
- WACV
- ICCV
- Pattern Recognit. Lett.
- CVPR
- IEEE Trans. Image Process.
- Signal Image Video Process.
- NeurIPS
- AAAI
- IGARSS
- Vis. Comput.
- J. Electronic Imaging
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICLR
- BMVC
- Int. J. Comput. Vis. Robotics
- ICME
- Discret. Math.
- Entropy
- ACSCC
- IEICE Trans. Inf. Syst.
- ISBI
- VCIP
- PCM
- Comput. Biol. Medicine
- J. Intell. Fuzzy Syst.
- ACM Multimedia
- IEEE Trans. Instrum. Meas.
- IEEE Signal Process. Lett.
- Sensors
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