FEATURE DISTRIBUTIONS
Experts
- Dah-Jye Lee
- Matti Pietikäinen
- Timo Ojala
- Alok Desai
- Subrahmanyam Murala
- Wankou Yang
- Dan A. Ventura
- Ram Sarkar
- William Robson Schwartz
- Anurag Katakkar
- Chao Li
- Avirup Bhattacharyya
- Prithaj Banerjee
- Susmit Agrawal
- Ming Zhu
- Rui Zhu
- Yuzhou Cao
- Nikolai Kalischek
- Zachary C. Lipton
- R. Venkatesh Babu
- Liqing Zhang
- Ricardo Toledo
- Pu Yan
- Clay H. Yoo
- Dong Liang
- Lawrence Carin
- Tiziano Bianchi
- Konrad Schindler
- Masahiro Yamaguchi
- Chiranjib Sur
- Yanwei Fu
- Mita Nasipuri
- Jianan Wang
- Jing Lin
- Hiroshi Nagahashi
- R. Balasubramanian
- Junwei Han
- Bo An
- Jiawan Zhang
Venues
- CoRR
- ICIP
- ICPR
- Neurocomputing
- Pattern Recognit.
- Expert Syst. Appl.
- Multim. Tools Appl.
- IEEE Access
- ICASSP
- Remote. Sens.
- WACV
- ICCV
- Vis. Comput.
- NeurIPS
- Signal Image Video Process.
- IGARSS
- IEEE Trans. Image Process.
- CVPR
- Pattern Recognit. Lett.
- PCM
- IEEE Trans. Instrum. Meas.
- ICLR
- ISBI
- ACM Multimedia
- BMVC
- Comput. Biol. Medicine
- Entropy
- Discret. Math.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Comput. Vis. Robotics
- ICME
- VCIP
- Sensors
- ACSCC
- J. Electronic Imaging
- IEICE Trans. Inf. Syst.
- IET Image Process.
- IEEE Signal Process. Lett.
- ISVC (1)
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