FEATURE DISTRIBUTIONS
Experts
- Dah-Jye Lee
- Alok Desai
- Timo Ojala
- Matti Pietikäinen
- Subrahmanyam Murala
- Dan A. Ventura
- Ram Sarkar
- Wankou Yang
- William Robson Schwartz
- Renchunzi Xie
- Chamidu Atupelage
- Bo An
- Susmit Agrawal
- Chao Li
- Ayan Kumar Bhunia
- Manel Benaissa
- Sai Sree Harsha
- Clay H. Yoo
- Jiawan Zhang
- Ehsan Adeli
- Dong Liang
- Shi Han
- Yanwei Fu
- Akinori Hashiguchi
- Junwei Han
- Valentina De Simone
- Jun Tang
- Liqing Zhang
- Qingyu Zhao
- Wei-Chung Kang
- Yiran Chen
- Chung Ming Kuo
- Shiuh-Ku Weng
- Prithaj Banerjee
- Ni Lao
- Tianjia Zhang
- Hiroshi Nagahashi
- Tiziano Bianchi
- Tokiya Abe
Venues
- CoRR
- ICIP
- Pattern Recognit.
- ICASSP
- Neurocomputing
- ICPR
- Multim. Tools Appl.
- Expert Syst. Appl.
- IEEE Access
- WACV
- Remote. Sens.
- IGARSS
- CVPR
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- AAAI
- NeurIPS
- ICCV
- Signal Image Video Process.
- Vis. Comput.
- Discret. Math.
- Sensors
- J. Electronic Imaging
- IET Image Process.
- Comput. Biol. Medicine
- Int. J. Comput. Vis. Robotics
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- J. Intell. Fuzzy Syst.
- PCM
- ICME
- ISBI
- IEEE Signal Process. Lett.
- ACM Multimedia
- IEICE Trans. Inf. Syst.
- IEEE Trans. Instrum. Meas.
- Entropy
- VCIP
- ACSCC
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