SCALE INVARIANT FEATURE TRANSFORM
Experts
- Jiayi Ma
- Qi Tian
- Yen-Yu Lin
- Hunny Mehrotra
- Thanh Hong-Phuoc
- Giovanni Puglisi
- Ling Guan
- Fabio Bellavia
- Robert Sablatnig
- Sebastiano Battiato
- Rainer Lienhart
- Xiamu Niu
- Jiantao Zhou
- Katja Ludwig
- Sajid Saleem
- Zhenzhong Wei
- Roberto Caldelli
- Banshidhar Majhi
- Yizhang Liu
- Takeshi Ikenaga
- Qingmin Liao
- Stefano Soatto
- Junjun Jiang
- Julie Delon
- Wen Gao
- Shin'ichi Satoh
- J. M. Hans du Buf
- Jeng-Shyang Pan
- Munish Kumar
- Andrea Costanzo
- Bing-Yu Chen
- Yanping Li
- Daniel Kienzle
- Irene Amerini
- Axel Gräser
- Guangjun Zhang
- Bo Jiang
- Abdul Bais
- Francesca Odone
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- ICPR
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Geosci. Remote. Sens.
- CVPR
- Remote. Sens.
- IEEE Access
- IEEE Trans. Image Process.
- ICCV
- Pattern Recognit.
- Pattern Recognit. Lett.
- Sensors
- ICASSP
- IGARSS
- ICRA
- IEICE Trans. Inf. Syst.
- J. Electronic Imaging
- SMC
- 计算机科学
- CVPR Workshops
- WACV
- Int. J. Comput. Vis.
- IROS
- EUSIPCO
- Int. J. Pattern Recognit. Artif. Intell.
- IET Comput. Vis.
- ACM Multimedia
- ICME
- IEEE Trans. Inf. Forensics Secur.
- Neurocomputing
- IET Image Process.
- ICMV
- Vis. Comput.
- ISCAS
- IEEE Trans. Pattern Anal. Mach. Intell.
- VISAPP (2)
- MVA
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