Deterministic broadside test generation for transition path delay faults.
Bo YaoIrith PomeranzSudhakar M. ReddyPublished in: ACM Great Lakes Symposium on VLSI (2010)
Keyphrases
- test generation
- test cases
- mutation testing
- black box
- test sequences
- symbolic execution
- design automation
- fluid model
- software testing
- static analysis
- test suite
- regression testing
- test set
- fault diagnosis
- quality assurance
- test data generation
- shortest path
- information systems
- destination node
- database
- image processing
- neural network
- source code
- knowledge management
- feature space