Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL.
Tsuyoshi ShinogiTerumine HayashiKazuo TakiPublished in: Asian Test Symposium (1997)
Keyphrases
- test generation
- test cases
- mutation testing
- built in self test
- test sequences
- integrated circuit
- design automation
- symbolic execution
- high speed
- fault diagnosis
- software testing
- binary decision diagrams
- fault detection
- static analysis
- test data generation
- low power
- quality assurance
- test set
- error rate
- real world
- complex systems
- heuristic search algorithms
- circuit design
- database applications
- vision system
- spl times
- open source
- software engineering
- artificial intelligence