Inspection of surface defects in copper strip using multivariate statistical approach and SVM.
Xuewu ZhangFang GongLi-Zhong XuPublished in: Int. J. Comput. Appl. Technol. (2012)
Keyphrases
- multivariate statistical
- surface defects
- printed circuit boards
- surface inspection
- support vector machine svm
- machine vision
- linear discriminant analysis
- automated visual inspection
- support vector
- multiple regression
- quality control
- canonical correlation analysis
- photometric stereo
- visual inspection
- knn
- support vector machine
- integrated circuit
- svm classifier
- discriminant analysis
- feature selection
- generalization ability
- vision system
- feature vectors
- manufacturing process
- feature space
- defect detection
- data sets
- k nearest neighbor
- image processing
- pairwise
- training data
- pattern recognition
- dimension reduction
- ls svm
- logistic regression
- real time