Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits.

Salvador Mir Bernard Courtois Marcelo Lubaszewski Vladimir Kolarik

Published in: ED&TC (1996)

Keyphrases

test generation
automatic diagnosis
test cases
design automation
quality assurance
shift register
high speed
static analysis
symbolic execution
test sequences
model based diagnosis
mutation testing
database
object oriented
fault diagnosis
quality control