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A Test Pattern Quality Metric for Diagnosis of Multiple Stuck-at and Transition faults.
Sarmad Tanwir
Michael S. Hsiao
Loganathan Lingappan
Published in:
ACM Great Lakes Symposium on VLSI (2017)
Keyphrases
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fault diagnosis
quality metrics
fault detection
multiple faults
model based diagnosis
fault detection and diagnosis
test cases
quality evaluation
diagnostic tests
quality estimation
built in self test
data mining
fault model
visual features
low level
data analysis
computational complexity
image sequences