Test Generation of Path Delay Faults Induced by Defects in Power TSV.
Chi-Jih ShihShih-An HsiehYi-Chang LuJames Chien-Mo LiTzong-Lin WuKrishnendu ChakrabartyPublished in: Asian Test Symposium (2013)
Keyphrases
- test generation
- test cases
- mutation testing
- symbolic execution
- test sequences
- design automation
- quality assurance
- path length
- software testing
- test data generation
- test suite
- static analysis
- power consumption
- fault diagnosis
- neural network
- power dissipation
- shortest path
- destination node
- model based diagnosis
- multicast tree
- test set
- image processing