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Testing multiple stuck-at faults of ROBDD based combinational circuit design.

Toral ShahAnzhela Yu. MatrosovaBinod KumarMasahiro FujitaVirendra Singh
Published in: LATS (2017)
Keyphrases
  • circuit design
  • test cases
  • digital circuits
  • design automation
  • data sets
  • website
  • fault diagnosis
  • combining multiple