Login / Signup

Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences.

Arnaud VirazelRené DavidPatrick GirardChristian LandraultSerge Pravossoudovitch
Published in: J. Electron. Test. (2001)
Keyphrases
  • test sequences
  • test cases
  • test generation
  • neural network
  • real time
  • databases
  • video sequences
  • fault diagnosis
  • data sets
  • case study
  • fault model