BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic.
Jacopo FrancoS. GrazianoBen KaczerFelice CrupiLars-Åke RagnarssonTibor GrasserGuido GroesenekenPublished in: Microelectron. Reliab. (2012)
Keyphrases
- high speed
- classical logic
- defeasible logic
- multi valued
- set theory
- reliability assessment
- thresholding algorithm
- threshold selection
- linear logic
- asynchronous circuits
- abductive reasoning
- reliability analysis
- thresholding method
- predicate logic
- digital circuits
- neural network
- automated reasoning
- probability theory
- modal logic
- search engine
- genetic algorithm