Dynamically partitioned test scheduling with adaptive TAM configuration for power-constrained SoC testing.
Dan ZhaoShambhu J. UpadhyayaPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2005)
Keyphrases
- item response theory
- hardware software co design
- test cases
- software testing
- power consumption
- hardware and software
- test data
- scheduling problem
- low power
- scheduling algorithm
- test suite
- regression testing
- test sequences
- test generation
- model based testing
- statistical tests
- structural equation modeling
- dynamic adaptation
- resource allocation
- power allocation
- set of test cases
- real time database systems
- testing process
- test data generation
- optimal configuration
- integration testing