INDUSTRIAL PARTS
Experts
- Saburo Tsuji
- Masahiko Yachida
- Yuxiang Yang
- Mingyu Gao
- TaiFeng Li
- Liang Gao
- Linda G. Shapiro
- Peigen Li
- Quan-Ke Pan
- Diego Ayala
- David García
- Max A. Little
- Christoph M. Hoffmann
- J. A. D. W. Anderson
- Maria Alicandro
- Jelmer M. Wolterink
- Helmut Pottmann
- Andrei Lozzi
- Tien C. Hsia
- Bin Li
- Bo Yang
- Nasser Khalili
- Sergey M. Sokolov
- Kevis-Kokitsi Maninis
- Tegoeh Tjahjowidodo
- B. Preising
- Dexin Zhou
- Zhiwei He
- José M. Sebastián
- Ivana Isgum
- Thorsten Theobald
- Peter Yuen
- Vittorio Ferrari
- Farzin Mokhtarian
- Rajeev Jain
- Christoph Meinel
- Yordan P. Raykov
- Leopoldo Altamirano Robles
- Leonardo Fernández-Jambrina
Venues
- Sensors
- ICRA
- CoRR
- IROS
- Comput. Aided Des.
- ICCAD
- MVA
- IEEE Access
- Robotics Auton. Syst.
- IEEE Trans. Instrum. Meas.
- CASE
- Remote. Sens.
- DAC
- J. Intell. Robotic Syst.
- Comput. Graph.
- ICPR
- AIM
- M2VIP
- SIGGRAPH
- BMVC
- Image Vis. Comput.
- IEEE Des. Test
- ICPR (1)
- FMCAD
- Comput. Ind.
- J. Robotics Mechatronics
- ROBIO
- Int. J. Comput. Integr. Manuf.
- J. Comput. Inf. Sci. Eng.
- IEEE Trans. Ind. Electron.
- Mach. Vis. Appl.
- ICIP
- ISBI
- EMBC
- CAD/Graphics
- Proc. IEEE
- J. Sensors
- IJCAI
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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