APPEARANCE FEATURES
Experts
- Laura Leal-Taixé
- Aljosa Osep
- Bastian Leibe
- Pascal Fua
- Kris Kitani
- Luc Van Gool
- François Brémond
- Kuk-Jin Yoon
- Xinshuo Weng
- Jenq-Neng Hwang
- Ming-Hsuan Yang
- Christophe De Vleeschouwer
- K. C. Amit Kumar
- Hans-Peter Seidel
- Moongu Jeon
- Klaus Dietmayer
- Yunde Jia
- Mubarak Shah
- Dimitris N. Metaxas
- Fuxin Li
- Long Lan
- Patrick Dendorfer
- Jie Li
- Shoudong Han
- Bing Shuai
- Yizhou Wang
- Zhen Lei
- Stephan Reuter
- Alexander Liniger
- Jianbing Shen
- Jan-Nico Zaech
- Andrew G. Berneshawi
- Ba-Ngu Vo
- Matti Pietikäinen
- En Zhu
- Martin Danelljan
- Malte Pedersen
- Ganesh Sundaramoorthi
- Andreas Geiger
Venues
- CoRR
- CVPR
- ICCV
- ICIP
- ICRA
- IEEE Access
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IROS
- BMVC
- Neurocomputing
- Comput. Vis. Image Underst.
- FUSION
- Sensors
- CVPR Workshops
- Multim. Tools Appl.
- Pattern Recognit.
- Int. J. Comput. Vis.
- ACM Trans. Graph.
- AVSS
- WACV
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Trans. Image Process.
- Image Vis. Comput.
- RO-MAN
- Pattern Recognit. Lett.
- ITSC
- ICME
- Vis. Comput.
- ICCV Workshops
- IEEE Trans. Intell. Transp. Syst.
- ICASSP
- IV
- IJCAI
- Remote. Sens.
- IEEE Signal Process. Lett.
- MFI
- IET Comput. Vis.
- ACIVS
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