Yuta Kimi

Publication Activity (10 Years)

Years Active: 2014-2016
Publications (10 Years): 1

Top Topics

Cache Conscious

Dynamic Random Access Memory

Top Venues

IEICE Trans. Electron.

Publications

Go Matsukawa, Yuta Kimi, Shuhei Yoshida, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto
Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (6) (2016)
Yuta Kimi, Go Matsukawa, Shuhei Yoshida, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto
Analysis of Soft Error Propagation Considering Masking Effects on Re-Convergent Path. ATS (2015)
Yuta Kimi, Go Matsukawa, Shuhei Yoshida, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto
An accurate soft error propagation analysis technique considering temporal masking disablement. IOLTS (2015)
Go Matsukawa, Yohei Nakata, Yasuo Sugure, Shigeru Oho, Yuta Kimi, Masafumi Shimozawa, Shuhei Yoshida, Hiroshi Kawaguchi, Masahiko Yoshimoto
A Low-Latency DMR Architecture with Fast Checkpoint Recovery Scheme. IEICE Trans. Electron. (4) (2015)
Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto
A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering ×91 Failure Rate Improvement under 35% Supply Voltage Fluctuation. IEICE Trans. Electron. (4) (2014)
Go Matsukawa, Yohei Nakata, Yuta Kimi, Yasuo Sugure, Masafumi Shimozawa, Shigeru Oho, Hiroshi Kawaguchi, Masahiko Yoshimoto
A Low-Latency DMR Architecture with Efficient Recovering Scheme Exploiting Simultaneously Copiable SRAM. ARCS Workshops (2014)
Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto
A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement. ISQED (2014)