Login / Signup

A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering ×91 Failure Rate Improvement under 35% Supply Voltage Fluctuation.

Yohei NakataYuta KimiShunsuke OkumuraJinwook JungTakuya SawadaTaku ToshikawaMakoto NagataHirofumi NakanoMakoto YabuuchiHidehiro FujiwaraKoji NiiHiroyuki KawaiHiroshi KawaguchiMasahiko Yoshimoto
Published in: IEICE Trans. Electron. (2014)
Keyphrases
  • failure rate
  • main memory
  • cache conscious
  • data access
  • data sets
  • decision trees
  • probabilistic model
  • random variables
  • memory management
  • dynamic random access memory