Taku Toshikawa

Publication Activity (10 Years)

Years Active: 2012-2018
Publications (10 Years): 1

Top Topics

Comparative Evaluation

Cache Conscious

Dynamic Random Access Memory

Top Venues

IEICE Electron. Express

IEICE Trans. Electron.

Publications

Tsuyoshi Ebuchi, Taku Toshikawa, Seiji Watanabe, Yutaka Terada, Toru Iwata
An ultra-wide range (0.01-240 Gbps) transmitter with latched AC-coupled driver and dummy data transient generator. IEICE Electron. Express 15 (3) (2018)
Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto
A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering ×91 Failure Rate Improvement under 35% Supply Voltage Fluctuation. IEICE Trans. Electron. (4) (2014)
Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto
A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement. ISQED (2014)
Tsuyoshi Ebuchi, Taku Toshikawa, Seiji Watanabe, Tomohiro Tsuchiya, Yutaka Terada, Tomoko Chiba, Keijiro Umehara, Toru Iwata, Takefumi Yoshikawa
A jitter suppression technique against data pattern dependency on high-speed interfaces for highly integrated SoCs. IEICE Electron. Express 11 (22) (2014)
Takuya Sawada, Taku Toshikawa, Kumpei Yoshikawa, Hidehiro Takata, Koji Nii, Makoto Nagata
Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation. IEICE Trans. Electron. (4) (2012)