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Wen-Kuan Yeh
Publication Activity (10 Years)
Years Active: 2007-2020
Publications (10 Years): 3
Top Topics
Nano Scale
Silicon On Insulator
Skin Surface
High Speed
Top Venues
Microelectron. Reliab.
IRPS
J. Sensors
IEICE Trans. Electron.
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Publications
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Wen Yang
,
Jiann-Shiun Yuan
,
Balakrishnan Krishnan
,
An-Jye Tzou
,
Wen-Kuan Yeh
Substrate Bias Effect on Dynamic Characteristics of a Monolithically Integrated GaN Half-Bridge.
IRPS
(2020)
Wen-Teng Chang
,
Shih-Wei Lin
,
Min-Cheng Chen
,
Wen-Kuan Yeh
Relationship of Channel and Surface Orientation to Mechanical and Electrical Stresses on N-Type FinFETs.
IEICE Trans. Electron.
(6) (2019)
Wenqi Zhang
,
Tzuo-Li Wang
,
Yan-hua Huang
,
Tsu-Ting Cheng
,
Shih-Yao Chen
,
Yiying Li
,
Chun-Hsiang Hsu
,
Chih-Jui Lai
,
Wen-Kuan Yeh
,
Yilin Yang
Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs.
Microelectron. Reliab.
67 (2016)
Wen-Teng Chang
,
Chun-Ming Lai
,
Wen-Kuan Yeh
Reliability of the doping concentration in an ultra-thin body and buried oxide silicon on insulator (SOI) and comparison with a partially depleted SOI.
Microelectron. Reliab.
54 (2) (2014)
Po-Ying Chen
,
Chi-Chang Chen
,
Wen-Kuan Yeh
,
Yukan Chang
,
Der-Chen Huang
,
Shyr-Shen Yu
,
Chwei-Shyong Tsai
,
Yu-Jung Huang
,
Wei-Cheng Lin
,
Shao-I Chu
,
Chung-Long Pan
,
Tsung-Hung Lin
,
Shyh-Chang Liu
Using Capacitance Sensor to Extract Characteristic Signals of Dozing from Skin Surface.
J. Sensors
2014 (2014)
Wen-Kuan Yeh
,
Po-Ying Chen
,
Kwang-Jow Gan
,
Jer-Chyi Wang
,
Chao-Sung Lai
The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET.
Microelectron. Reliab.
53 (2) (2013)
Jiann-Shiun Yuan
,
Wen-Kuan Yeh
,
Shuyu Chen
,
Chia-Wei Hsu
NBTI reliability on high-k metal-gate SiGe transistor and circuit performances.
Microelectron. Reliab.
51 (5) (2011)
Jiann-Shiun Yuan
,
J. Ma
,
Wen-Kuan Yeh
,
Chia-Wei Hsu
Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances.
Microelectron. Reliab.
50 (6) (2010)
Chia-Wei Hsu
,
Yean-Kuen Fang
,
Wen-Kuan Yeh
,
Chun-Yu Chen
,
Yen-Ting Chiang
,
Feng-Renn Juang
,
Chien-Ting Lin
,
Chieh-Ming Lai
high-k/metal gate MOSFET device with oxygen post deposition annealing.
Microelectron. Reliab.
50 (5) (2010)
Chia-Wei Hsu
,
Yean-Kuen Fang
,
Wen-Kuan Yeh
,
Chien-Ting Lin
Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer.
Microelectron. Reliab.
48 (11-12) (2008)
Chieh-Ming Lai
,
Yean-Kuen Fang
,
Chien-Ting Lin
,
Chia-Wei Hsu
,
Wen-Kuan Yeh
The impacts of high tensile stress CESL and geometry design on device performance and reliability for 90 nm SOI nMOSFETs.
Microelectron. Reliab.
47 (6) (2007)